Automatic device for measuring of principal thermoelectric parameters of lead chalcogenides
https://doi.org/10.30724/1998-9903-2017-19-7-8-126-132
Abstract
The device intended for measuring of principal thermoelectric parameters of the narrow-gap lead chalcogenide semiconductors (the Seebeck coefficient, electrical conductivity and thermal conductivity) have been created. The device created can be controlled by personal computer. In the temperature range from 270K to 500K the correctness of values of the thermoelectric parameters measured by the device are following: thermal conductivity – ±5,7%; electrical conductivity – ±3,5%; the Seebeck coefficient – ±4%.
About the Authors
A. M. Sinicin
Kazan State Power Engineering University, Kazan
Russian Federation
assistant, Industrial electronics and light engineering department
Russian Federation
assistant, Industrial electronics and light engineering department
V. A. Ulanov
Kazan State Power Engineering University, Kazan
Russian Federation
associate professor, doctor of physical-mathematical sciences, Industrial electronics and light engineering department
Russian Federation
associate professor, doctor of physical-mathematical sciences, Industrial electronics and light engineering department
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Review
For citations:
Sinicin A.M., Ulanov V.A. Automatic device for measuring of principal thermoelectric parameters of lead chalcogenides. Power engineering: research, equipment, technology. 2017;19(7-8):126-132. (In Russ.) https://doi.org/10.30724/1998-9903-2017-19-7-8-126-132
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